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1 Ergebnisse
1
An Improved Stress-strain Model Considering the Aging Effec..:
, In:
2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia)
,
Yuan, Shuoxun
;
Wang, Laili
;
Liu, Yi
... - p. 1724-1728 , 2024
Link:
https://doi.org/10.1109/IPEMC-ECCEAsia60879.2024.10567..
RT T1 <cTitle>2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia)</cTitle>: T1 <Title>An Improved Stress-strain Model Considering the Aging Effect of Solder Layers</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10567492&Exemplar=1&LAN=DE A1 Yuan, Shuoxun A1 Wang, Laili A1 Liu, Yi A1 Chen, Qiling A1 Zhao, Zhiqiang A1 Gao, Kai YR 2024 K1 Insulated gate bipolar transistors K1 Temperature sensors K1 Analytical models K1 Costs K1 Correlation K1 Accuracy K1 Deformation K1 aging effect K1 reliability K1 solder layer K1 stress-strain relationship SP 1724 OP 1728 LK http://dx.doi.org/https://doi.org/10.1109/IPEMC-ECCEAsia60879.2024.10567492 DO https://doi.org/10.1109/IPEMC-ECCEAsia60879.2024.10567492 SF ELIB - SuUB Bremen
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