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1 Ergebnisse
1
High-Voltage Thyristor Leakage Current Measurement Using Ga..:
, In:
2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia)
,
Meng, Hui
;
Xiang, Letian
;
Zuo, Luwei
... - p. 824-829 , 2024
Link:
https://doi.org/10.1109/IPEMC-ECCEAsia60879.2024.10567..
RT T1 <cTitle>2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia)</cTitle>: T1 <Title>High-Voltage Thyristor Leakage Current Measurement Using Gate Voltage Vgk Under Non-trigger Current</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10567502&Exemplar=1&LAN=DE A1 Meng, Hui A1 Xiang, Letian A1 Zuo, Luwei A1 Luo, Haoze A1 Xin, Zhen A1 Chen, Zhong A1 Zhu, Lin YR 2024 K1 Temperature measurement K1 Degradation K1 Thyristors K1 Voltage measurement K1 Temperature K1 Current measurement K1 Accelerated aging K1 aging test K1 gate voltage K1 leakage current K1 thyristor SP 824 OP 829 LK http://dx.doi.org/https://doi.org/10.1109/IPEMC-ECCEAsia60879.2024.10567502 DO https://doi.org/10.1109/IPEMC-ECCEAsia60879.2024.10567502 SF ELIB - SuUB Bremen
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