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1 Ergebnisse
1
Design-for-Test for Intermittent Faults in STT-MRAMs:
, In:
2024 IEEE European Test Symposium (ETS)
,
Yuan, Sicong
;
Yaldagard, Mohammad Amin
;
Xun, Hanzhi
... - p. 1-6 , 2024
Link:
https://doi.org/10.1109/ETS61313.2024.10567702
RT T1
2024 IEEE European Test Symposium (ETS)
: T1
Design-for-Test for Intermittent Faults in STT-MRAMs
UL https://suche.suub.uni-bremen.de/peid=ieee-10567702&Exemplar=1&LAN=DE A1 Yuan, Sicong A1 Yaldagard, Mohammad Amin A1 Xun, Hanzhi A1 Fieback, Moritz A1 Marinissen, Erik Jan A1 Kim, Woojin A1 Rao, Siddharth A1 Couet, Sebastien A1 Taouil, Mottaqiallah A1 Hamdioui, Said YR 2024 SN 1558-1780 K1 Torque K1 Simulation K1 Discrete Fourier transforms K1 Random access memory K1 Switches K1 Production K1 Design for testability K1 STT-MRAM K1 MTJ K1 test development K1 design for test K1 defect K1 fault K1 stochasticity SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ETS61313.2024.10567702 DO https://doi.org/10.1109/ETS61313.2024.10567702 SF ELIB - SuUB Bremen
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