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1 Ergebnisse
1
Scan Design Using Unsupervised Machine Learning to Reduce F..:
, In:
2024 IEEE European Test Symposium (ETS)
,
Goel, Sandeep Kumar
;
Patidar, Ankita
;
Lee, Frank
- p. 1-4 , 2024
Link:
https://doi.org/10.1109/ETS61313.2024.10567936
RT T1
2024 IEEE European Test Symposium (ETS)
: T1
Scan Design Using Unsupervised Machine Learning to Reduce Functional Timing and Area Impact
UL https://suche.suub.uni-bremen.de/peid=ieee-10567936&Exemplar=1&LAN=DE A1 Goel, Sandeep Kumar A1 Patidar, Ankita A1 Lee, Frank YR 2024 SN 1558-1780 K1 Measurement K1 Learning systems K1 Machine learning algorithms K1 Machine learning K1 Traveling salesman problems K1 Routing K1 Timing SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ETS61313.2024.10567936 DO https://doi.org/10.1109/ETS61313.2024.10567936 SF ELIB - SuUB Bremen
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