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1 Ergebnisse
1
Condition Monitoring the Inhomogeneous Thermal Fatigue of M..:
, In:
2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia)
,
Zhang, Jun
;
Shen, Huixian
;
Sun, Pengju
. - p. 2648-2653 , 2024
Link:
https://doi.org/10.1109/IPEMC-ECCEAsia60879.2024.10567..
RT T1 <cTitle>2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia)</cTitle>: T1 <Title>Condition Monitoring the Inhomogeneous Thermal Fatigue of Multi-chip IGBT Module Based on the Natural Frequency of Thermal Network</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10567937&Exemplar=1&LAN=DE A1 Zhang, Jun A1 Shen, Huixian A1 Sun, Pengju A1 Ma, Xing YR 2024 K1 Insulated gate bipolar transistors K1 Condition monitoring K1 Degradation K1 Performance evaluation K1 Nonhomogeneous media K1 Fatigue K1 Power electronics K1 inhomogeneous thermal fatigue K1 multi-chip IGBT module K1 natural frequency of thermal network SP 2648 OP 2653 LK http://dx.doi.org/https://doi.org/10.1109/IPEMC-ECCEAsia60879.2024.10567937 DO https://doi.org/10.1109/IPEMC-ECCEAsia60879.2024.10567937 SF ELIB - SuUB Bremen
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