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1 Ergebnisse
1
Cross-Layer Reliability Analysis of NVDLA Accelerators: Exp..:
, In:
2024 IEEE European Test Symposium (ETS)
,
Veronesi, Alessandro
;
Nazzari, Alessandro
;
Passarello, Dario
... - p. 1-6 , 2024
Link:
https://doi.org/10.1109/ETS61313.2024.10568018
RT T1
2024 IEEE European Test Symposium (ETS)
: T1
Cross-Layer Reliability Analysis of NVDLA Accelerators: Exploring the Configuration Space
UL https://suche.suub.uni-bremen.de/peid=ieee-10568018&Exemplar=1&LAN=DE A1 Veronesi, Alessandro A1 Nazzari, Alessandro A1 Passarello, Dario A1 Krstic, Milos A1 Favalli, Michele A1 Cassano, Luca A1 Miele, Antonio A1 Bertozzi, Davide A1 Bolchini, Cristiana YR 2024 SN 1558-1780 K1 Cross layer design K1 Accuracy K1 Systematics K1 Single event upsets K1 Artificial neural networks K1 Solids K1 Robustness K1 Deep Neural Networks K1 Error Simulation K1 Fault Injection K1 Cross-Layer Reliability Analysis K1 Accelerators SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ETS61313.2024.10568018 DO https://doi.org/10.1109/ETS61313.2024.10568018 SF ELIB - SuUB Bremen
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