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1 Ergebnisse
1
Automated Defect Detection in Electronic Components using C..:
, In:
2024 Ninth International Conference on Science Technology Engineering and Mathematics (ICONSTEM)
,
Shobanadevi, A.
;
Kottu, Sreekanth
;
Kumar, K R Senthil
... - p. 1-6 , 2024
Link:
https://doi.org/10.1109/ICONSTEM60960.2024.10568637
RT T1
2024 Ninth International Conference on Science Technology Engineering and Mathematics (ICONSTEM)
: T1
Automated Defect Detection in Electronic Components using Convolutional Neural Networks
UL https://suche.suub.uni-bremen.de/peid=ieee-10568637&Exemplar=1&LAN=DE A1 Shobanadevi, A. A1 Kottu, Sreekanth A1 Kumar, K R Senthil A1 Amudha, K. A1 Praveena, K. A1 Venkatesh, R. YR 2024 K1 Training K1 Productivity K1 Process control K1 Quality control K1 Streaming media K1 Mathematics K1 Manufacturing K1 Automated defect detection K1 Electronic components K1 Convolutional neural networks K1 CNN K1 Image analysis SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ICONSTEM60960.2024.10568637 DO https://doi.org/10.1109/ICONSTEM60960.2024.10568637 SF ELIB - SuUB Bremen
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