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1 Ergebnisse
1
AI-Driven Test and Measurement Automation in Electronics Ma..:
, In:
2024 Ninth International Conference on Science Technology Engineering and Mathematics (ICONSTEM)
,
Agrawal, Anurag Vijay
;
Raju, Kommisetti Murthy
;
P, Aparna
... - p. 1-6 , 2024
Link:
https://doi.org/10.1109/ICONSTEM60960.2024.10568717
RT T1 <cTitle>2024 Ninth International Conference on Science Technology Engineering and Mathematics (ICONSTEM)</cTitle>: T1 <Title>AI-Driven Test and Measurement Automation in Electronics Manufacturing</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10568717&Exemplar=1&LAN=DE A1 Agrawal, Anurag Vijay A1 Raju, Kommisetti Murthy A1 P, Aparna A1 Sravya, Gade A1 Chandrashekhar, A A1 Ramya, J. YR 2024 K1 Manufacturing processes K1 Production K1 Metrology K1 Product design K1 Mathematics K1 Quality assessment K1 Task analysis K1 Automated Test Systems K1 Electronic Manufacturing Automation K1 AI-Enhanced Test Equipment K1 Quality Assurance Automation K1 Automated Metrology Systems SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ICONSTEM60960.2024.10568717 DO https://doi.org/10.1109/ICONSTEM60960.2024.10568717 SF ELIB - SuUB Bremen
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