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1 Ergebnisse
1
Pioneering Excellence in Semiconductor Manufacturing via XG..:
, In:
2024 IEEE International Conference on Big Data & Machine Learning (ICBDML)
,
Dwivedi, Abhishek
;
Khan, Nikhat Raza
- p. 216-220 , 2024
Link:
https://doi.org/10.1109/ICBDML60909.2024.10577393
RT T1
2024 IEEE International Conference on Big Data & Machine Learning (ICBDML)
: T1
Pioneering Excellence in Semiconductor Manufacturing via XGBoost with BAT Optimization for Cutting-Edge Predictive Maintenance
UL https://suche.suub.uni-bremen.de/peid=ieee-10577393&Exemplar=1&LAN=DE A1 Dwivedi, Abhishek A1 Khan, Nikhat Raza YR 2024 K1 Semiconductor device modeling K1 Accuracy K1 Production K1 Predictive models K1 Semiconductor device manufacture K1 Prediction algorithms K1 Cleaning K1 Predictive Maintenance K1 XGBoost K1 BAT Algorithm K1 SMOTE-EEN K1 Multicolinearity SP 216 OP 220 LK http://dx.doi.org/https://doi.org/10.1109/ICBDML60909.2024.10577393 DO https://doi.org/10.1109/ICBDML60909.2024.10577393 SF ELIB - SuUB Bremen
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