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A more appropriate testing method for the characterization ..:
, In:
2024 IEEE Electrical Insulation Conference (EIC)
,
Seri, P.
;
Demian, D.
;
Reolon, A.
. - p. 401-404 , 2024
Link:
https://doi.org/10.1109/EIC58847.2024.10579385
RT T1 <cTitle>2024 IEEE Electrical Insulation Conference (EIC)</cTitle>: T1 <Title>A more appropriate testing method for the characterization of dielectric systems in power modules</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10579385&Exemplar=1&LAN=DE A1 Seri, P. A1 Demian, D. A1 Reolon, A. A1 Cavallini, A. YR 2024 SN 2993-3684 K1 Partial discharges K1 Insulation K1 Breakdown voltage K1 Voltage measurement K1 Power measurement K1 Pulse measurements K1 Multichip modules K1 Power Electronics K1 Substrates K1 Partial Discharges K1 Silicon Carbide SP 401 OP 404 LK http://dx.doi.org/https://doi.org/10.1109/EIC58847.2024.10579385 DO https://doi.org/10.1109/EIC58847.2024.10579385 SF ELIB - SuUB Bremen
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