I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Influence of Structure Parameters on the RoN, sp of Quasi- ..:
, In:
2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)
,
Wu, Tuanzhuang
;
Wei, Jiaxing
;
Wang, Weidong
... - p. 418-421 , 2024
Link:
https://doi.org/10.1109/ISPSD59661.2024.10579557
RT T1 <cTitle>2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)</cTitle>: T1 <Title>Influence of Structure Parameters on the RoN, sp of Quasi- Vertical Power DMOS Compatible with 0.18μm BCD Process</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10579557&Exemplar=1&LAN=DE A1 Wu, Tuanzhuang A1 Wei, Jiaxing A1 Wang, Weidong A1 Lin, Xiaonan A1 Ma, Jie A1 Li, Sheng A1 Ye, Ran A1 Zhang, Long A1 Ding, Desheng A1 Liu, Siyang A1 Sun, Weifeng A1 Xu, Chaoqi A1 Zhang, Yi A1 Lin, Feng YR 2024 SN 1946-0201 K1 Performance evaluation K1 Resistance K1 Semiconductor device measurement K1 MOSFET K1 Power measurement K1 Logic gates K1 Silicon K1 Quasi-vertical K1 LDMOS K1 BCD process SP 418 OP 421 LK http://dx.doi.org/https://doi.org/10.1109/ISPSD59661.2024.10579557 DO https://doi.org/10.1109/ISPSD59661.2024.10579557 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
