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1 Ergebnisse
1
CMOS Gate Driver with Integrated Gate Current Monitoring Me..:
, In:
2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)
,
El Boubkari, Anas
;
Rouger, Nicolas
;
Richardeau, Frederic
... - p. 454-457 , 2024
Link:
https://doi.org/10.1109/ISPSD59661.2024.10579581
RT T1
2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)
: T1
CMOS Gate Driver with Integrated Gate Current Monitoring Method for Fault Under Load Short Circuit Detection of SiC Power Modules
UL https://suche.suub.uni-bremen.de/peid=ieee-10579581&Exemplar=1&LAN=DE A1 El Boubkari, Anas A1 Rouger, Nicolas A1 Richardeau, Frederic A1 Calmes, Pierre A1 Bacchi, Matthew A1 Blaquiere, Jean-Marc A1 Vinnac, Sebastien A1 Cousineau, Marc YR 2024 SN 1946-0201 K1 Silicon carbide K1 Multichip modules K1 Switches K1 Logic gates K1 Capacitance K1 Sensors K1 Power semiconductor devices K1 SiC MOSFET K1 short-circuit type 2 K1 Fault Under Load K1 CMOS K1 Gate Driver K1 Current sensing K1 Short-Circuit K1 Fault detection K1 CGD capacitance SP 454 OP 457 LK http://dx.doi.org/https://doi.org/10.1109/ISPSD59661.2024.10579581 DO https://doi.org/10.1109/ISPSD59661.2024.10579581 SF ELIB - SuUB Bremen
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