I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
CMOS Gate Driver with Integrated Gate Current Monitoring Me..:
, In:
2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)
,
El Boubkari, Anas
;
Rouger, Nicolas
;
Richardeau, Frederic
... - p. 454-457 , 2024
Link:
https://doi.org/10.1109/ISPSD59661.2024.10579581
RT T1 <cTitle>2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)</cTitle>: T1 <Title>CMOS Gate Driver with Integrated Gate Current Monitoring Method for Fault Under Load Short Circuit Detection of SiC Power Modules</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10579581&Exemplar=1&LAN=DE A1 El Boubkari, Anas A1 Rouger, Nicolas A1 Richardeau, Frederic A1 Calmes, Pierre A1 Bacchi, Matthew A1 Blaquiere, Jean-Marc A1 Vinnac, Sebastien A1 Cousineau, Marc YR 2024 SN 1946-0201 K1 Silicon carbide K1 Multichip modules K1 Switches K1 Logic gates K1 Capacitance K1 Sensors K1 Power semiconductor devices K1 SiC MOSFET K1 short-circuit type 2 K1 Fault Under Load K1 CMOS K1 Gate Driver K1 Current sensing K1 Short-Circuit K1 Fault detection K1 CGD capacitance SP 454 OP 457 LK http://dx.doi.org/https://doi.org/10.1109/ISPSD59661.2024.10579581 DO https://doi.org/10.1109/ISPSD59661.2024.10579581 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
