I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
3.3 kV-Class 4H-SiC Epi-Refilled Super-Junction Diode with ..:
, In:
2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)
,
Cheng, Haoyuan
;
Wang, Hengyu
;
Zhang, Chi
... - p. 13-16 , 2024
Link:
https://doi.org/10.1109/ISPSD59661.2024.10579635
RT T1 <cTitle>2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)</cTitle>: T1 <Title>3.3 kV-Class 4H-SiC Epi-Refilled Super-Junction Diode with Repetitive Surge Current Robustness</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10579635&Exemplar=1&LAN=DE A1 Cheng, Haoyuan A1 Wang, Hengyu A1 Zhang, Chi A1 Wang, Ce A1 Wan, Jiangbin A1 Han, Jingrui A1 Ting, Hungkit A1 Que, Qianqian A1 Li, Yanjun A1 Bai, Miaoguang A1 Wu, Yiding A1 Sheng, Kuang YR 2024 SN 1946-0201 K1 Performance evaluation K1 Schottky diodes K1 Silicon carbide K1 Schottky barriers K1 Switches K1 Robustness K1 Etching K1 Super-junction K1 trench-refilling K1 hexagonal cell K1 surge robustness SP 13 OP 16 LK http://dx.doi.org/https://doi.org/10.1109/ISPSD59661.2024.10579635 DO https://doi.org/10.1109/ISPSD59661.2024.10579635 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
