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1 Ergebnisse
1
An Integrated Low-Power Enhanced Pull-Up GaN Driver Using S..:
, In:
2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)
,
Zhuang, Chun-Wang
;
Ming, Xin
;
Ye, Zi-Kai
... - p. 351-354 , 2024
Link:
https://doi.org/10.1109/ISPSD59661.2024.10579657
RT T1
2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)
: T1
An Integrated Low-Power Enhanced Pull-Up GaN Driver Using SenseHEMT for Reliable and Fast Short-Circuit Protection
UL https://suche.suub.uni-bremen.de/peid=ieee-10579657&Exemplar=1&LAN=DE A1 Zhuang, Chun-Wang A1 Ming, Xin A1 Ye, Zi-Kai A1 Qin, Yao A1 Gong, Xin-Ce A1 Lu, Yi A1 Li, Si-Chao A1 Zhou, Qi A1 Zhang, Bo YR 2024 SN 1946-0201 K1 Semiconductor device measurement K1 Current measurement K1 Logic gates K1 Inverters K1 Time measurement K1 Sensors K1 Reliability K1 Monolithic GaN integration K1 low-power enhanced pull-up (LPEP) technique K1 short-circuit protection K1 senseHEMT SP 351 OP 354 LK http://dx.doi.org/https://doi.org/10.1109/ISPSD59661.2024.10579657 DO https://doi.org/10.1109/ISPSD59661.2024.10579657 SF ELIB - SuUB Bremen
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