I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Degradation Behavior of SiC Trench MOSFETs by Total-Ionizin..:
, In:
2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)
,
Chen, Zhengjia
;
Xu, Hongyi
;
He, Yufu
... - p. 228-231 , 2024
Link:
https://doi.org/10.1109/ISPSD59661.2024.10579668
RT T1 <cTitle>2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)</cTitle>: T1 <Title>Degradation Behavior of SiC Trench MOSFETs by Total-Ionizing-dose Irradiation Under Gate Voltage Stress</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10579668&Exemplar=1&LAN=DE A1 Chen, Zhengjia A1 Xu, Hongyi A1 He, Yufu A1 Ji, Manyi A1 Zhu, Zhengyu A1 Hu, Zhijian A1 Wan, Xin A1 Ren, Na A1 Sheng, Kuang YR 2024 SN 1946-0201 K1 Resistance K1 Degradation K1 MOSFET K1 Radiation effects K1 Silicon carbide K1 Logic gates K1 Threshold voltage K1 SiC Trench MOSFETs K1 Total-Ionizing-Des K1 Gate damage SP 228 OP 231 LK http://dx.doi.org/https://doi.org/10.1109/ISPSD59661.2024.10579668 DO https://doi.org/10.1109/ISPSD59661.2024.10579668 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
