I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Comprehensive Study on Trapping-Induced Dynamics in β-Ga2O3..:
, In:
2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)
,
Wang, Haoran
;
Lai, Chun-Hao
;
Huang, Po-Yen
... - p. 224-227 , 2024
Link:
https://doi.org/10.1109/ISPSD59661.2024.10579683
RT T1 <cTitle>2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)</cTitle>: T1 <Title>Comprehensive Study on Trapping-Induced Dynamics in β-Ga2O3Schottky Barrier Diodes Under Continuous Switching Stress</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10579683&Exemplar=1&LAN=DE A1 Wang, Haoran A1 Lai, Chun-Hao A1 Huang, Po-Yen A1 Lin, Yuan-An A1 Hsu, Shawn S.H. A1 Wong, Roy K.-Y. YR 2024 SN 1946-0201 K1 Performance evaluation K1 Schottky diodes K1 Schottky barriers K1 Switches K1 Voltage K1 Energy states K1 Power semiconductor devices K1 β-Ga2O3 K1 SBD K1 Continuous Switching K1 Stability K1 Active energy K1 Trapping SP 224 OP 227 LK http://dx.doi.org/https://doi.org/10.1109/ISPSD59661.2024.10579683 DO https://doi.org/10.1109/ISPSD59661.2024.10579683 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
