I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
2kV Low Leakage Vertical NiO/β-Ga2O3 Hetero-Junction Diode ..:
, In:
2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)
,
Wan, Jiangbin
;
Wang, Hengyu
;
Cheng, Haoyuan
... - p. 200-203 , 2024
Link:
https://doi.org/10.1109/ISPSD59661.2024.10579688
RT T1 <cTitle>2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)</cTitle>: T1 <Title>2kV Low Leakage Vertical NiO/β-Ga2O3 Hetero-Junction Diode and its Thermal/Electrical Stability</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10579688&Exemplar=1&LAN=DE A1 Wan, Jiangbin A1 Wang, Hengyu A1 Cheng, Haoyuan A1 Wang, Ce A1 Que, Qianqian A1 Li, Yanjun A1 Zhang, Chi A1 Sun, Jiabao A1 Liu, Dong A1 Sheng, Kuang YR 2024 SN 1946-0201 K1 Stability analysis K1 Dielectrics K1 Semiconductor process modeling K1 Semiconductor diodes K1 Leakage currents K1 Electric fields K1 Anodes K1 Power electronics application K1 ultra-wide bandgap semiconductor K1 gallium oxide K1 nickel oxide K1 deep trench K1 deep mesa K1 termination SP 200 OP 203 LK http://dx.doi.org/https://doi.org/10.1109/ISPSD59661.2024.10579688 DO https://doi.org/10.1109/ISPSD59661.2024.10579688 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
