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1 Ergebnisse
1
A Lightweight Insulator Defect Detection Model Based on YOL..:
, In:
2024 5th International Seminar on Artificial Intelligence, Networking and Information Technology (AINIT)
,
Wang, Lei
;
Qin, Junping
;
Yan, Kai
... - p. 2349-2353 , 2024
Link:
https://doi.org/10.1109/AINIT61980.2024.10581815
RT T1 <cTitle>2024 5th International Seminar on Artificial Intelligence, Networking and Information Technology (AINIT)</cTitle>: T1 <Title>A Lightweight Insulator Defect Detection Model Based on YOLOv8</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10581815&Exemplar=1&LAN=DE A1 Wang, Lei A1 Qin, Junping A1 Yan, Kai A1 Sun, Hao A1 Sun, Shulan A1 Geng, Yunan YR 2024 K1 Seminars K1 Computational modeling K1 Image edge detection K1 Insulators K1 Feature extraction K1 Real-time systems K1 Neck K1 defect detection K1 YOLOv8 K1 ShuffleNet K1 cross-scale feature fusion module SP 2349 OP 2353 LK http://dx.doi.org/https://doi.org/10.1109/AINIT61980.2024.10581815 DO https://doi.org/10.1109/AINIT61980.2024.10581815 SF ELIB - SuUB Bremen
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