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1 Ergebnisse
1
Closed-Loop Test Scheme of Microcomputer Protection Based o..:
, In:
2024 IEEE 7th International Electrical and Energy Conference (CIEEC)
,
Shao, Xiaofei
;
Cong, Wei
;
Lv, Jing
... - p. 1155-1160 , 2024
Link:
https://doi.org/10.1109/CIEEC60922.2024.10583314
RT T1 <cTitle>2024 IEEE 7th International Electrical and Energy Conference (CIEEC)</cTitle>: T1 <Title>Closed-Loop Test Scheme of Microcomputer Protection Based on Off-Line Simulation Software</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10583314&Exemplar=1&LAN=DE A1 Shao, Xiaofei A1 Cong, Wei A1 Lv, Jing A1 Lin, Chunhua A1 Yin, Xiaoguang A1 Shan, Xiaochen YR 2024 K1 Digital-analog conversion K1 Digital simulation K1 Microcomputers K1 Software K1 Real-time systems K1 Hardware K1 Delays K1 Off-line simulation K1 Microcomputer protection K1 Digital-to-analog conversion K1 Closed loop test SP 1155 OP 1160 LK http://dx.doi.org/https://doi.org/10.1109/CIEEC60922.2024.10583314 DO https://doi.org/10.1109/CIEEC60922.2024.10583314 SF ELIB - SuUB Bremen
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