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1 Ergebnisse
1
Study on Electrode Damage Behavior of Metallized Film Capac..:
, In:
2024 IEEE 7th International Electrical and Energy Conference (CIEEC)
,
Wang, Kaizheng
;
Kong, Dezhao
;
Yang, Xudong
... - p. 4344-4347 , 2024
Link:
https://doi.org/10.1109/CIEEC60922.2024.10583645
RT T1 <cTitle>2024 IEEE 7th International Electrical and Energy Conference (CIEEC)</cTitle>: T1 <Title>Study on Electrode Damage Behavior of Metallized Film Capacitors Based on Finite Element Method</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10583645&Exemplar=1&LAN=DE A1 Wang, Kaizheng A1 Kong, Dezhao A1 Yang, Xudong A1 Fu, Yitong A1 Wang, Shuaiqi A1 Tan, Yizhang YR 2024 K1 Electrodes K1 Power system measurements K1 Electric breakdown K1 Density measurement K1 Capacitors K1 Windings K1 Geometric modeling K1 Metallized film capacitor (MFC) K1 finite element simulation K1 electrode damage K1 self-healing breakdown SP 4344 OP 4347 LK http://dx.doi.org/https://doi.org/10.1109/CIEEC60922.2024.10583645 DO https://doi.org/10.1109/CIEEC60922.2024.10583645 SF ELIB - SuUB Bremen
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