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1 Ergebnisse
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Predicting Line-Level Defects by Capturing Code Contexts wi..:
, In:
2024 IEEE International Conference on Software Analysis, Evolution and Reengineering (SANER)
,
Mahbub, Parvez
;
Rahman, Mohammad Masudur
- p. 308-319 , 2024
Link:
https://doi.org/10.1109/SANER60148.2024.00038
RT T1 <cTitle>2024 IEEE International Conference on Software Analysis, Evolution and Reengineering (SANER)</cTitle>: T1 <Title>Predicting Line-Level Defects by Capturing Code Contexts with Hierarchical Transformers</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10589817&Exemplar=1&LAN=DE A1 Mahbub, Parvez A1 Rahman, Mohammad Masudur YR 2024 SN 2640-7574 K1 Measurement K1 Codes K1 Costs K1 Accuracy K1 Reviews K1 Biological system modeling K1 Software quality K1 software quality assurance K1 line-level defect prediction K1 deep learning K1 transformers SP 308 OP 319 LK http://dx.doi.org/https://doi.org/10.1109/SANER60148.2024.00038 DO https://doi.org/10.1109/SANER60148.2024.00038 SF ELIB - SuUB Bremen
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