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Research on Real-Time Image Stitching for Wafer Defect Insp..:

, In: 2023 International Conference on Computational Science and Computational Intelligence (CSCI),
Kwon, So-Young ; Kim, Young-Hyung ; Jung, Dong-Soo. - p. 1300-1301 , 2023
Link: https://doi.org/10.1109/CSCI62032.2023.00214