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1 Ergebnisse
1
Deep Learning Detection of Defect-Free Bangles: Machine Vis..:
, In:
2023 2nd International Engineering Conference on Electrical, Energy, and Artificial Intelligence (EICEEAI)
,
Alon, Helcy D.
;
Alon, Alvin Sarraga
;
Evangelista, Ryan S.
... - p. 1-6 , 2023
Link:
https://doi.org/10.1109/EICEEAI60672.2023.10590367
RT T1 <cTitle>2023 2nd International Engineering Conference on Electrical, Energy, and Artificial Intelligence (EICEEAI)</cTitle>: T1 <Title>Deep Learning Detection of Defect-Free Bangles: Machine Vision Approach for Quality Assurance in Bangle Manufacturing</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10590367&Exemplar=1&LAN=DE A1 Alon, Helcy D. A1 Alon, Alvin Sarraga A1 Evangelista, Ryan S. A1 Ligayo, Michael Angelo Delos Santos A1 Reyes, Ryan A1 Reyes, Michelle C. A1 Merin, Jovencio A1 Austria, Yolanda D. YR 2023 K1 Deep learning K1 Fault diagnosis K1 Analytical models K1 Accuracy K1 Quality assurance K1 Machine vision K1 Quality control K1 Bangle Detection K1 Machine Vision K1 Mask-RCNN K1 Quality Assurance K1 Transfer Learning SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/EICEEAI60672.2023.10590367 DO https://doi.org/10.1109/EICEEAI60672.2023.10590367 SF ELIB - SuUB Bremen
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