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1 Ergebnisse
1
A Semiconductor Manufacturing Final Test Yield Classificati..:
, In:
2024 Second International Conference on Data Science and Information System (ICDSIS)
,
Dineshkumar, R.
;
Aluvala, Srinivas
;
Srinath, Suma
.. - p. 1-4 , 2024
Link:
https://doi.org/10.1109/ICDSIS61070.2024.10594688
RT T1 <cTitle>2024 Second International Conference on Data Science and Information System (ICDSIS)</cTitle>: T1 <Title>A Semiconductor Manufacturing Final Test Yield Classification Using Random Forest</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10594688&Exemplar=1&LAN=DE A1 Dineshkumar, R. A1 Aluvala, Srinivas A1 Srinath, Suma A1 Alsalami, Zaid A1 Krishnaprasath, V T YR 2024 K1 Measurement K1 Accuracy K1 Laboratories K1 Production K1 Semiconductor device manufacture K1 Feature extraction K1 Prediction algorithms K1 Final test K1 Gaussian Mixture K1 improved grid search K1 Label Encoder K1 One Hot Encoder K1 Semi-conductor SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ICDSIS61070.2024.10594688 DO https://doi.org/10.1109/ICDSIS61070.2024.10594688 SF ELIB - SuUB Bremen
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