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1 Ergebnisse
1
Secondary Fault Identification Method Based on the Extremel..:
, In:
2024 IEEE 33rd International Symposium on Industrial Electronics (ISIE)
,
Yang, Shiwu
;
Chen, Qing
;
Li, Hongbin
... - p. 1-7 , 2024
Link:
https://doi.org/10.1109/ISIE54533.2024.10595757
RT T1 <cTitle>2024 IEEE 33rd International Symposium on Industrial Electronics (ISIE)</cTitle>: T1 <Title>Secondary Fault Identification Method Based on the Extremely Low Frequency Current Measurement</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10595757&Exemplar=1&LAN=DE A1 Yang, Shiwu A1 Chen, Qing A1 Li, Hongbin A1 Jiao, Yang A1 Tian, Ruoyan A1 He, Yuxiang YR 2024 SN 2163-5145 K1 Fault diagnosis K1 Support vector machines K1 Modulation K1 Interference K1 Vectors K1 Power grids K1 Mathematical models SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.1109/ISIE54533.2024.10595757 DO https://doi.org/10.1109/ISIE54533.2024.10595757 SF ELIB - SuUB Bremen
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