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1 Ergebnisse
1
Serial Arc Faults in Future Embedded HVDC Networks : a Stud..:
, In:
2024 IEEE Transportation Electrification Conference and Expo (ITEC)
,
Yousra, Aichoun
;
Romaric, Landfried
;
Thierry, Leblanc
. - p. 1-6 , 2024
Link:
https://doi.org/10.1109/ITEC60657.2024.10599031
RT T1 <cTitle>2024 IEEE Transportation Electrification Conference and Expo (ITEC)</cTitle>: T1 <Title>Serial Arc Faults in Future Embedded HVDC Networks : a Study in the Context of More Electric Aircraft (MEA)</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10599031&Exemplar=1&LAN=DE A1 Yousra, Aichoun A1 Romaric, Landfried A1 Thierry, Leblanc A1 Philippe, Teste YR 2024 SN 2473-7631 K1 Voltage measurement K1 Phase measurement K1 Current measurement K1 HVDC transmission K1 Noise K1 Transportation K1 Energy measurement K1 MEA K1 Serial Arc Faults K1 HVDC SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ITEC60657.2024.10599031 DO https://doi.org/10.1109/ITEC60657.2024.10599031 SF ELIB - SuUB Bremen
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