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Practical Considerations for RF Measurements of Cryogenic C..:

, In: 2024 IEEE/MTT-S International Microwave Symposium - IMS 2024,

Frolov, Daniil ; Chakraborty, Sudipto ; Underwood, Devin... - p. 706-709 , 2024

Link: https://doi.org/10.1109/IMS40175.2024.10600328

RT 
T1 <cTitle>2024 IEEE/MTT-S International Microwave Symposium - IMS 2024</cTitle>: T1 <Title>Practical Considerations for RF Measurements of Cryogenic CMOS Circuits for Quantum Computing</Title>

UL https://suche.suub.uni-bremen.de/peid=ieee-10600328&Exemplar=1&LAN=DE
				
A1 Frolov, Daniil
A1 Chakraborty, Sudipto
A1 Underwood, Devin
A1 Glick, Joseph
A1 Timmerwilke, John
A1 Robertazzi, Ray
A1 Inoue, Ken
A1 Yeck, Mark
A1 Rosno, Pat
A1 Snell, Bryce
A1 Moertl, Daniel
A1 Lekuch, Scott
A1 DeSantis, Christopher
A1 Tien, Kevin
A1 Plouchart, Jean-Olivier
A1 Frank, David
A1 Wisnieff, Dorothy
A1 Bulzacchelli, John
A1 Baks, Chris
A1 Friedman, Daniel
A1 Gaucher, Brian
YR 2024
SN 2576-7216
K1 Microwave measurement
K1 Radio frequency
K1 Wiring
K1 Semiconductor device measurement
K1 Power measurement
K1 Qubit
K1 Cryogenics
K1 CMOS
K1 RF measurements
K1 cryogenic calibration
K1 characterization
SP 706
OP 709
LK http://dx.doi.org/https://doi.org/10.1109/IMS40175.2024.10600328
DO https://doi.org/10.1109/IMS40175.2024.10600328
SF ELIB - SuUB Bremen

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