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Homogeneous Generation of Randomized Tests for Different Gr..:

, In: 2024 XVI Congreso de Tecnología, Aprendizaje y Enseñanza de la Electrónica (TAEE),
Mora-Merchan, Javier M. ; Personal, Enrique ; Garcia, Sebastian... - p. 1-5 , 2024
Link: https://doi.org/10.1109/TAEE59541.2024.10604890