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1 Ergebnisse
1
Self-aligned Scaled Planar N-polar GaN HEMTs with Raised Re..:
, In:
2024 Device Research Conference (DRC)
,
Wang, Boyu
;
Khan, Kamruzzaman
;
Akso, Emre
... - p. 1-2 , 2024
Link:
https://doi.org/10.1109/DRC61706.2024.10605411
RT T1
2024 Device Research Conference (DRC)
: T1
Self-aligned Scaled Planar N-polar GaN HEMTs with Raised Regrowth
UL https://suche.suub.uni-bremen.de/peid=ieee-10605411&Exemplar=1&LAN=DE A1 Wang, Boyu A1 Khan, Kamruzzaman A1 Akso, Emre A1 Collins, Henry A1 Chavan, Tanmay A1 Guidry, Matthew A1 Mishra, Umesh YR 2024 SN 2640-6853 K1 Breakdown voltage K1 Voltage measurement K1 Current measurement K1 Molecular beam epitaxial growth K1 Logic gates K1 HEMTs K1 Velocity measurement SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.1109/DRC61706.2024.10605411 DO https://doi.org/10.1109/DRC61706.2024.10605411 SF ELIB - SuUB Bremen
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