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1 Ergebnisse
1
Yield and Hot-Spot Analysis for Replacing Bypass Diodes wit..:
, In:
2024 International Symposium on Power Electronics, Electrical Drives, Automation and Motion (SPEEDAM)
,
Manthey, Tobias
;
Graue, Janosch
;
Kuhne, Philip
. - p. 782-787 , 2024
Link:
https://doi.org/10.1109/SPEEDAM61530.2024.10609173
RT T1 <cTitle>2024 International Symposium on Power Electronics, Electrical Drives, Automation and Motion (SPEEDAM)</cTitle>: T1 <Title>Yield and Hot-Spot Analysis for Replacing Bypass Diodes with PV Module-Integrated Microinverters</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10609173&Exemplar=1&LAN=DE A1 Manthey, Tobias A1 Graue, Janosch A1 Kuhne, Philip A1 Friebe, Jens YR 2024 SN 2835-8457 K1 Temperature distribution K1 Voltage measurement K1 Short-circuit currents K1 Energy measurement K1 Power electronics K1 Hardware K1 Data models K1 PV module K1 bypass diodes K1 partial shading K1 global irradiance K1 hot spots K1 PV microinverter SP 782 OP 787 LK http://dx.doi.org/https://doi.org/10.1109/SPEEDAM61530.2024.10609173 DO https://doi.org/10.1109/SPEEDAM61530.2024.10609173 SF ELIB - SuUB Bremen
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