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Investigation of Traps Effect on 2D-MoS2 Photoresistor:
, In:
2024 IEEE International Conference on Electro Information Technology (eIT)
,
Abdel-Motaleb, Ibrahim
;
Brooks, Tyler
- p. 157-162 , 2024
Link:
https://doi.org/10.1109/eIT60633.2024.10609852
RT T1 <cTitle>2024 IEEE International Conference on Electro Information Technology (eIT)</cTitle>: T1 <Title>Investigation of Traps Effect on 2D-MoS2 Photoresistor</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10609852&Exemplar=1&LAN=DE A1 Abdel-Motaleb, Ibrahim A1 Brooks, Tyler YR 2024 SN 2154-0373 K1 Performance evaluation K1 Electron traps K1 Analytical models K1 Spontaneous emission K1 Simulation K1 Time measurement K1 Sulfur K1 2D-MoS2 K1 Photoresistor K1 Traps effect SP 157 OP 162 LK http://dx.doi.org/https://doi.org/10.1109/eIT60633.2024.10609852 DO https://doi.org/10.1109/eIT60633.2024.10609852 SF ELIB - SuUB Bremen
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