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1 Ergebnisse
1
Relation Between Chalking of HTV and Decay-Like Aging of FR..:
, In:
2024 IEEE 5th International Conference on Dielectrics (ICD)
,
Peng, Yanan
;
Li, Wendong
;
Zeng, Shiyin
... - p. 1-4 , 2024
Link:
https://doi.org/10.1109/ICD59037.2024.10613114
RT T1 <cTitle>2024 IEEE 5th International Conference on Dielectrics (ICD)</cTitle>: T1 <Title>Relation Between Chalking of HTV and Decay-Like Aging of FRP in Composite Insulators</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10613114&Exemplar=1&LAN=DE A1 Peng, Yanan A1 Li, Wendong A1 Zeng, Shiyin A1 Liu, Yuelin A1 Hua, Xiaochang A1 Yan, Xinyi A1 Zhang, Guanjun YR 2024 SN 2834-8311 K1 Temperature K1 Surface discharges K1 Accelerated aging K1 Resists K1 Aging K1 Discharges (electric) K1 Filling K1 Composite insulator K1 decay-like aging K1 HTV K1 chalking K1 accelerated aging SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ICD59037.2024.10613114 DO https://doi.org/10.1109/ICD59037.2024.10613114 SF ELIB - SuUB Bremen
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