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1 Ergebnisse
1
Efficient Optimized Testing of Resistive RAM Based Convolut..:
, In:
2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS)
,
Saha, Anurup
;
Ma, Kwondo
;
Amarnath, Chandramouli
. - p. 1-7 , 2024
Link:
https://doi.org/10.1109/IOLTS60994.2024.10616092
RT T1 <cTitle>2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS)</cTitle>: T1 <Title>Efficient Optimized Testing of Resistive RAM Based Convolutional Neural Networks</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10616092&Exemplar=1&LAN=DE A1 Saha, Anurup A1 Ma, Kwondo A1 Amarnath, Chandramouli A1 Chatterjee, Abhijit YR 2024 SN 1942-9401 K1 Backpropagation K1 Accuracy K1 Resistive RAM K1 Neural networks K1 Prediction algorithms K1 Convolutional neural networks K1 Low latency communication K1 Resistive Random-Access Memory (RRAM) K1 Convolutional neural network (CNN) testing K1 Predictive testing SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.1109/IOLTS60994.2024.10616092 DO https://doi.org/10.1109/IOLTS60994.2024.10616092 SF ELIB - SuUB Bremen
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