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Strain and composition in thin SiGe buffer layers with high..:

, In: The Fourth International Conference on Advanced Semiconductor Devices and Microsystem,
Perova, T.S. ; Lyutovich, K. ; Potapova, D.... - p. 191,192,193,194 , 2002
Link: https://doi.org/10.1109/ASDAM.2002.1088504