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Measurement techniques for evaluating thin-film piezoelectr..:
, In:
1968 IEEE International Solid-State Circuits Conference. Digest of Technical Papers
,
Bahr, A.
;
Reeder, T.
- p. 14,15 , 1968
Link:
https://doi.org/10.1109/ISSCC.1968.1154600
RT T1
1968 IEEE International Solid-State Circuits Conference. Digest of Technical Papers
: T1
Measurement techniques for evaluating thin-film piezoelectric transducers
UL https://suche.suub.uni-bremen.de/peid=ieee-1154600&Exemplar=1&LAN=DE A1 Bahr, A. A1 Reeder, T. YR 1968 K1 Measurement techniques K1 Piezoelectric films K1 Piezoelectric transducers K1 Coupling circuits K1 Loss measurement K1 Frequency K1 Equations K1 Piezoelectric materials K1 Zinc oxide K1 Equivalent circuits SP 14,15 LK http://dx.doi.org/https://doi.org/10.1109/ISSCC.1968.1154600 DO https://doi.org/10.1109/ISSCC.1968.1154600 SF ELIB - SuUB Bremen
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