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1 Ergebnisse
1
Fully integrated 64 Kb MRAM with novel reference cell schem:
, In:
Digest. International Electron Devices Meeting,
,
Jeong, H.S.
;
Kim, H.J.
;
Hong, J.S.
... - p. 551,552,553,554 , 2002
Link:
https://doi.org/10.1109/IEDM.2002.1175901
RT T1 <cTitle>Digest. International Electron Devices Meeting,</cTitle>: T1 <Title>Fully integrated 64 Kb MRAM with novel reference cell scheme</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-1175901&Exemplar=1&LAN=DE A1 Jeong, H.S. A1 Kim, H.J. A1 Hong, J.S. A1 Jeong, W.C. A1 Lee, S.H. A1 Park, J.H. A1 Cho, W.Y. A1 Kim, J.S. A1 Song, S.H. A1 Park, S.O. A1 Jeong, U.I. A1 Jeong, G.T. A1 Kim, K. A1 Koh, G.H. A1 Song, I.H. A1 Park, W.J. A1 Kim, T.W. A1 Jeong, S.J. A1 Hwang, Y.N. A1 Ahn, S.J. YR 2002 K1 Magnetic tunneling K1 Voltage K1 CMOS technology K1 CMOS process K1 Tin K1 Magnetic separation K1 Etching K1 Clamps K1 Circuits K1 Research and development SP 551,552,553,554 LK http://dx.doi.org/https://doi.org/10.1109/IEDM.2002.1175901 DO https://doi.org/10.1109/IEDM.2002.1175901 SF ELIB - SuUB Bremen
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