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A new linearity measurement algorithm for sub-micron microw..:

, In: Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412),
Woo Young Choi ; Byung Yong Choi ; Dong-Soo Woo.. - p. 374,375,376 , 2003
Link: https://doi.org/10.1109/IMTC.2003.1208183