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Comparison of radiation hardening techniques for standard C..:
, In:
Proceedings of the Twentieth National Radio Science Conference (NRSC'2003) (IEEE Cat. No.03EX665)
,
Salem, Mona S.
;
Salem, Marwa S.
;
Kayed, Somaya I.
. - p. 1-8 , 2003
Link:
https://doi.org/10.1109/NRSC.2003.157355
RT T1
Proceedings of the Twentieth National Radio Science Conference (NRSC'2003) (IEEE Cat. No.03EX665)
: T1
Comparison of radiation hardening techniques for standard CMOS technologies
UL https://suche.suub.uni-bremen.de/peid=ieee-1217374&Exemplar=1&LAN=DE A1 Salem, Mona S. A1 Salem, Marwa S. A1 Kayed, Somaya I. A1 Ragai, Hani F. YR 2003 K1 CMOS technology K1 Radiation hardening K1 Inverters K1 Circuits K1 MOSFETs K1 Electron traps K1 Threshold voltage K1 Ionizing radiation K1 X-rays K1 Electron mobility SP 1 OP 8 LK http://dx.doi.org/https://doi.org/10.1109/NRSC.2003.157355 DO https://doi.org/10.1109/NRSC.2003.157355 SF ELIB - SuUB Bremen
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