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Test application time and volume compression through seed o..:

, In: Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451),
Rao, W. ; Bayraktaroglu, I. ; Orailoglu, A. - p. 732,733,734,735,736,737 , 2003
Link: https://doi.org/10.1145/775832.776020