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1 Ergebnisse
1
DF for low cost testers [Tutorial]:
, In:
Proceedings Design, Automation and Test in Europe Conference and Exhibition
,
Gizopoulos, D.
;
Eide, G.
;
Crouch, A.
. - p. xxx , 2004
Link:
https://doi.org/10.1109/DATE.2004.1268806
RT T1
Proceedings Design, Automation and Test in Europe Conference and Exhibition
: T1
DF for low cost testers [Tutorial]
UL https://suche.suub.uni-bremen.de/peid=ieee-1268806&Exemplar=1&LAN=DE A1 Gizopoulos, D. A1 Eide, G. A1 Crouch, A. A1 Posse, K. YR 2004 SN 1530-1591 K1 Tutorial K1 Costs K1 Design for testability K1 Design engineering K1 Knowledge engineering K1 Integrated circuit testing K1 Formal verification K1 Design automation K1 Synchronization K1 Test equipment SP xxx LK http://dx.doi.org/https://doi.org/10.1109/DATE.2004.1268806 DO https://doi.org/10.1109/DATE.2004.1268806 SF ELIB - SuUB Bremen
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