I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Generation of subassembly compact half models through exper..:

, In: Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545),
Weiss, J. ; Thomas, E. ; Dairo, A.... - p. 262-270 , 2004
Link: https://doi.org/10.1109/STHERM.2004.1291333