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Pose invariant affect analysis using thin-plate splines:

, In: Proceedings of the 17th International Conference on Pattern Recognition, 2004. ICPR 2004.,
McCall, J.C. ; Trivedi, M.M. - p. 958,959,960,961,962,963,964 , 2004
Link: https://doi.org/10.1109/ICPR.2004.1334688