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1
Opportunities with the open architecture test system:
, In:
ASP-DAC 2004: Asia and South Pacific Design Automation Conference 2004 (IEEE Cat. No.04EX753)
,
Hatayama, K.
;
Rajsuman, R.
;
Cheng-Wen Wu
... - p. 334-334 , 2004
Link:
https://doi.org/10.1109/ASPDAC.2004.1337591
RT T1
ASP-DAC 2004: Asia and South Pacific Design Automation Conference 2004 (IEEE Cat. No.04EX753)
: T1
Opportunities with the open architecture test system
UL https://suche.suub.uni-bremen.de/peid=ieee-1337591&Exemplar=1&LAN=DE A1 Hatayama, K. A1 Rajsuman, R. A1 Cheng-Wen Wu A1 Nishimura, Y. A1 Chakradhar, S. A1 Merschon, A. A1 Petrich, D. A1 Tada, T. YR 2004 K1 System testing K1 Research and development K1 Semiconductor device testing K1 Laboratories K1 Test equipment K1 Costs K1 Integrated circuit testing K1 Semiconductor device manufacture SP 334 OP 334 LK http://dx.doi.org/https://doi.org/10.1109/ASPDAC.2004.1337591 DO https://doi.org/10.1109/ASPDAC.2004.1337591 SF ELIB - SuUB Bremen
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