Titel

Merkliste
1 Ergebnisse

Novel robust cell capacitor (Leaning Exterminated Ring type..:

, In: Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004.,

Park, J.M. ; Hwang, Y.S. ; Shin, D.W.... - p. 34-35 , 2004

Link: https://doi.org/10.1109/VLSIT.2004.1345377

RT 
T1 <cTitle>Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004.</cTitle>: T1 <Title>Novel robust cell capacitor (Leaning Exterminated Ring type Insulator) and new storage node contact (Top Spacer Contract) for 70nm DRAM technology and beyond</Title>

UL https://suche.suub.uni-bremen.de/peid=ieee-1345377&Exemplar=1&LAN=DE
				
A1 Park, J.M.
A1 Hwang, Y.S.
A1 Shin, D.W.
A1 Huh, M.
A1 Kim, D.H.
A1 Hwang, H.K.
A1 Oh, H.J.
A1 Song, J.W.
A1 Kang, N.J.
A1 Lee, B.H.
A1 Yun, C.J.
A1 Shim, M.S.
A1 Kim, S.E.
A1 Kim, J.Y.
A1 Kwon, J.M.
A1 Park, B.J.
A1 Lee, J.W.
A1 Kim, D.I.
A1 Cho, M.H.
A1 Jeong, M.Y.
A1 Kim, H.J.
A1 Kim, H.J.
A1 Kim, H.S.
A1 Jin, G.Y.
A1 Park, Y.G.
A1 Kim, Kinam
YR 2004
K1 Robustness
K1 Capacitors
K1 Insulation
K1 Contracts
K1 Random access memory
K1 Space technology
K1 Parasitic capacitance
K1 Contacts
K1 Tin
K1 Electric variables
SP 34
OP 35
LK http://dx.doi.org/https://doi.org/10.1109/VLSIT.2004.1345377
DO https://doi.org/10.1109/VLSIT.2004.1345377
SF ELIB - SuUB Bremen

Export

RefWorks (nur Desktop-Version!)
Flow (Zuerst in Flow einloggen, dann importieren)