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Efficient improvement of hot-carrier-induced degradation fo..:

, In: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743),
Chieh-Ming Lai ; Yean-Kuen Fang ; Wen-Kuan Yeh... - p. 275-278 , 2004
Link: https://doi.org/10.1109/IPFA.2004.1345622