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1 Ergebnisse
1
Intrinsic parameter fluctuations in conventional MOSFETs at..:
, In:
2004 Abstracts 10th International Workshop on Computational Electronics
,
Adamu-Lema, F.
;
Roy, G.
;
Brown, A. R.
.. - p. 44-45 , 2004
Link:
https://doi.org/10.1109/IWCE.2004.1407312
RT T1 <cTitle>2004 Abstracts 10th International Workshop on Computational Electronics</cTitle>: T1 <Title>Intrinsic parameter fluctuations in conventional MOSFETs at the scaling limit: a statistical study</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-1407312&Exemplar=1&LAN=DE A1 Adamu-Lema, F. A1 Roy, G. A1 Brown, A. R. A1 Asenov, A. A1 Roy, S. YR 2004 K1 MOSFETs K1 Semiconductor device modeling SP 44 OP 45 LK http://dx.doi.org/https://doi.org/10.1109/IWCE.2004.1407312 DO https://doi.org/10.1109/IWCE.2004.1407312 SF ELIB - SuUB Bremen
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