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Inspection of defect on LCD panel using polynomial approxim..:

, In: 2004 IEEE Region 10 Conference TENCON 2004.,
Seung-Il Baek ; Woo-Seob Kim ; Tak-Mo Koo.. - p. 235,236,237,238 , 2004
Link: https://doi.org/10.1109/TENCON.2004.1414400