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Algorithm for low power combinational circuit testing:

, In: 2004 IEEE Region 10 Conference TENCON 2004.,
Paramasivam, K. ; Gunavathi, K. ; Sathishkumar, P. - p. 336,337,338,339 , 2004
Link: https://doi.org/10.1109/TENCON.2004.1414938