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1 Ergebnisse
1
The effect of elevated temperature lifetest on low frequenc..:
, In:
JEDEC (formerly the GaAs REL Workshop) ROCS Workshop, 2004.
,
Chou, Y.C.
;
Eng, D.
;
Block, T.
... - p. 69,70,71,72,73,74,75,76,77,78,79 , 2004
Link:
https://doi.org/10.1109/ROCS.2004.184348
RT T1
JEDEC (formerly the GaAs REL Workshop) ROCS Workshop, 2004.
: T1
The effect of elevated temperature lifetest on low frequency noise performance in GaAs PHEMT dual gate MMICs [LNA example]
UL https://suche.suub.uni-bremen.de/peid=ieee-1424939&Exemplar=1&LAN=DE A1 Chou, Y.C. A1 Eng, D. A1 Block, T. A1 Oki, A. A1 Callejo, L. A1 Biedenbander, M. A1 Lee, K. A1 Allen, B. A1 Lai, R. A1 Kan, Q. A1 Grundbacher, R. A1 Leung, D. YR 2004 K1 Temperature K1 Low-frequency noise K1 Gallium arsenide K1 PHEMTs K1 MMICs K1 Noise figure K1 Low-noise amplifiers K1 Noise measurement K1 Leakage current K1 Frequency SP 69,70,71,72,73,74,75,76,77,78,79 LK http://dx.doi.org/https://doi.org/10.1109/ROCS.2004.184348 DO https://doi.org/10.1109/ROCS.2004.184348 SF ELIB - SuUB Bremen
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