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1 Ergebnisse
1
Abnormal off-state leakage current increasing with reduced ..:
, In:
Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology, 2004.
,
Wenping Wang
;
Ru Huang
;
Guoyan Zhang
.. - p. 299,300,301 , 2004
Link:
https://doi.org/10.1109/ICSICT.2004.1435011
RT T1
Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology, 2004.
: T1
Abnormal off-state leakage current increasing with reduced silicon body thickness in nano-SOI devices
UL https://suche.suub.uni-bremen.de/peid=ieee-1435011&Exemplar=1&LAN=DE A1 Wenping Wang A1 Ru Huang A1 Guoyan Zhang A1 Shengqi Yang A1 Yangyuan Wang YR 2004 K1 Leakage current K1 Silicon K1 Nanoscale devices K1 MOSFET circuits K1 Doping K1 Tiles K1 Power MOSFET K1 Electrodes K1 Electrons K1 Microelectronics SP 299,300,301 LK http://dx.doi.org/https://doi.org/10.1109/ICSICT.2004.1435011 DO https://doi.org/10.1109/ICSICT.2004.1435011 SF ELIB - SuUB Bremen
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